Tin Whisker Growth Suppression Using NiO Sublayers Fabricated by Dip Coating Article (Web of Science)

cited authors

  • Buchanan, Jacob D.; Borra, Vamsi; Islam, Md Maidul; Georgiev, Daniel G.; Itapu, Srikanth

publication date

  • March 1, 2022

webpage

published in

category

keywords

  • NiO
  • Sn
  • electronic materials
  • failures
  • nickel oxide
  • reliability
  • whisker mitigation
  • whiskers

volume

  • 7

issue

  • 1