Structural and Optical Properties of Two-Stage CuInSe2 Thin Films Studied by Real Time Spectroscopic Ellipsometry Proceedings Paper (Web of Science)

cited authors

  • Sapkota, Dhurba R.; Pradhan, Puja; Koirala, Prakash; Irving, Richard; Phillips, Adam B.; Ellingson, Randy J.; Heben, Michael J.; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.; IEEE

publication date

  • January 1, 2019



  • ellipsometry
  • optical variables measurement
  • photovoltaic cells
  • thickness measurement
  • thin film devices

start page

  • 943

end page

  • 948