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A Versatile Optical Model Applied to CdTe and CdSe1-yTey Alloys: Sensitivity to Film Composition and Relative Defect Density
Proceedings Paper (Web of Science)
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cited authors
Junda, Maxwell M.; Grice, Corey R.; Uprety, Prakash; Koirala, Prakash; Collins, Robert W.; Yan, Yanfa; Podraza, Nikolas J.; IEEE
publication date
January 1, 2018
webpage
Web of Science
published in
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC)
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Research
category
ENGINEERING, ELECTRICAL & ELECTRONIC
Category
keywords
alloys
cadmium selenide
cadmium telluride
ellipsometry
thin films
Additional Document Info
start page
1902
end page
1905