A Versatile Optical Model Applied to CdTe and CdSe1-yTey Alloys: Sensitivity to Film Composition and Relative Defect Density Proceedings Paper (Web of Science)

cited authors

  • Junda, Maxwell M.; Grice, Corey R.; Uprety, Prakash; Koirala, Prakash; Collins, Robert W.; Yan, Yanfa; Podraza, Nikolas J.; IEEE

publication date

  • January 1, 2018



  • alloys
  • cadmium selenide
  • cadmium telluride
  • ellipsometry
  • thin films

start page

  • 1902

end page

  • 1905