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CRACK: Compromising ROPUFs via Augmented Challenges using Knowledge-Driven Models
Proceedings (Faculty180)
Overview
Overview
cited authors
Syed, Talha; Kulkarni, Akshay; Dobbali, Rohit; Niamat, Mohammed Y
authors
Niamat, Mohammed Y
publication date
2025
publisher
2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS)
Organization
presented at event
2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS)
Conference