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Log-Normal Statistics in Filamentary RRAM Devices and Related Systems
Article (Faculty180)
Overview
Additional Document Info
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Overview
cited authors
Karpov, V. G.; Niraula, D.
authors
Karpov, Victor G
publication date
2017
published in
IEEE ELECTRON DEVICE LETTERS
Journal
Additional Document Info
start page
1240
end page
1243
volume
38