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Segmentation of neuron and measurement of optically programed neurite growth: Fast automation via Bayesian thresholding
Proceedings (Faculty180)
Overview
Additional Document Info
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Overview
cited authors
Reddy, P.; Shukla, S.; Karunarathne, A.; Jana, S.; Giri, L.
publication date
2015
presented at event
2015 7th International IEEE/EMBS Conference on Neural Engineering (NER)
Conference
Additional Document Info
start page
996
end page
999