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Preparation of STM tips for in-situ characterization of electrode surfaces
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Heben, Michael J
Dovek, Moris M.
Lewis, Nathan S.
Penner, Reginald M.
Quate, Calvin F.
publication date
1988
webpage
http://dx.doi.org/10.1111/j.1365-2818.1988.tb01434.x
published in
Journal of Microscopy
Journal
Additional Document Info
number of pages
10
start page
651
end page
661
volume
152
issue
3