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An Examination of Computer-Aided Design (CAD) Usage Patterns, Product Architecture and Organizational Capabilities: Case Illustrations from Three Electronic Manufacturers
Article (Web of Science)
Overview
Identity
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Overview
authors
Park, Youngwon
Fujimoto, Takahiro
Yoshikawa, Ryozo
Hong, Paul C.
Abe, Takeshi
publication date
2007
webpage
http://dx.doi.org/10.1109/picmet.2007.4349329
Identity
International Standard Book Number (ISBN) 13
9781890843151