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Characterization of technetium radiopharmaceuticals by thin-layer spectroelectrochemistry
Review Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Kirchhoff, Jon R
Deutsch, Edward
Heineman, William R.
publication date
1986
webpage
http://dx.doi.org/10.1016/0731-7085(86)80088-7
published in
JOURNAL OF PHARMACEUTICAL AND BIOMEDICAL ANALYSIS
Journal
Additional Document Info
number of pages
10
start page
777
end page
787
volume
4
issue
6