Quantifying nanoscale order in amorphous materials: simulating fluctuation electron microscopy of amorphous silicon Article (Web of Science)

authors

  • Bogle, Stephanie N
  • Voyles, Paul M
  • Khare, Sanjay
  • Abelson, John R

publication date

  • 2007

webpage

published in

start page

  • 455204

volume

  • 19

issue

  • 45