Browse

Home
People
Departments & Colleges
Research
Research Area Overlaps

IEEE/ASME Transactions on Mechatronics Journal

Overview

Overview

publication venue for

Automated characterization and compensation for a compliant mechanism haptic device. 13:136. 2008

About

©2024 University of Toledo | Terms of Use | Powered by VIVO and the Web of Science (© 2024 Clarivate Analytics)